000 01427cam a2200361 a 4500
001 12825874
003 OSt
005 20140310182729.0
008 020620s2003 nyu b 001 0 eng
010 _a 2002026733
020 _a9812530185
040 _aDLC
_cDLC
_dDLC
043 _an-us---
050 0 0 _aLB 3051
_b.K8 2003
082 0 0 _a371.26/0973
_221
100 1 _aKubiszyn, Tom.
245 1 0 _aEducational testing and measurement :
_bclassroom application and practice /
_cTom Kubiszyn, Gary Borich.
250 _a7th ed.
260 _aNew York :
_bJ. Wiley & Sons, Inc.,
_c2003.
300 _a508 p. :
_c25 cm.
_bill. ;
504 _aIncludes bibliographical references (p. 484-494) and index.
521 _aEDU
541 _eC5207
562 _eFor circulation. 1 copy available in the collection.
650 0 _aEducational tests and measurements
_zUnited States.
700 1 _aBorich, Gary D.
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley036/2002026733.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/toc/wiley023/2002026733.html
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0613/2002026733-b.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2lcc
_cBK
_kFOR
955 _apc19 2002-06-20 to SSCD;
_csj11 2002-06-26;
_aaa03 2002-06-27
_aps11 2002-12-09 bk rec'd, to CIP ver.;
999 _c15440
_d15440